MATSCI172

Experimental x-ray diffraction techniques for microstructural analysis of materials, emphasizing powder and single-crystal techniques. Diffraction from epitaxial and polycrystalline thin films, multilayers, and amorphorous materials using medium and high resolution configurations. Determination of phase purity, crystallinity, relaxation, stress, and texture in the materials. Advanced experimental x-ray diffraction techniques: reciprocal lattice mapping, reflectivity, and grazing incidence diffraction. Enrollment limited to 20. Undergraduates register for 162 for 4 units; graduates register for 172 for 3 units. Prerequisites: MATSCI 143 or equivalent course in materials characterization.